Title:
ALIGNMENT SYSTEM, ALIGNMENT METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/023976
Kind Code:
A1
Abstract:
In the present invention, an alignment system (1) comprises: an image processing unit (400) that detects an identification object from a captured image of a workpiece (10) that includes the identification object, the identification object being detected via a rough search and a detailed search that employ different search methods; and an operation control unit (200) that controls drive devices (111, 112, 113) that move the workpiece (10), on the basis of actual coordinates of the identification object that is detected by the image processing unit (400). Detection of the identification object by the image processing unit (400) and control of the drive devices (111, 112, 113) by the operation control unit (400) are executed repeatedly. The detailed search is executed in a narrower search range than the range of the rough search, and in the next search after an identification object has been detected in the detailed search, the detailed search is executed without performing the rough search.
Inventors:
SUGIYAMA YOSHIHIRO (JP)
LEE WEIHAU (JP)
ASANO YUJI (JP)
LEE WEIHAU (JP)
ASANO YUJI (JP)
Application Number:
PCT/JP2022/028958
Publication Date:
February 01, 2024
Filing Date:
July 27, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05D3/12
Foreign References:
| JP2019215633A | 2019-12-19 | |||
| JP2022045522A | 2022-03-22 | |||
| JPH0936202A | 1997-02-07 | |||
| JP2002023851A | 2002-01-25 |
Attorney, Agent or Firm:
KIMURA Mitsuru (JP)
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