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Patent Searching and Data


Title:
APPARATUS AND METHOD FOR IMAGE ANALYSIS
Document Type and Number:
WIPO Patent Application WO/2023/214790
Kind Code:
A1
Abstract:
The present invention relates to an apparatus and method for image analysis and more specifically, relates to an apparatus and method for image analysis in which an absolute distance for a partial region of an image is calculated by using an auto focusing function, and the absolute distance is applied to an output of a depth map so as to calculate absolute distances for the remaining regions. The apparatus for image analysis, according to an embodiment of the present invention, comprises: an imaging unit for generating a captured image; a depth map generating unit for generating a depth map for the captured image; and a map analysis unit for calculating an absolute distance for the entire region of the depth map by referring to an absolute distance calculated for a selected region of the entire region of the depth map, wherein the map analysis unit calculates the absolute distance for the selected region by using an auto focus function of the imaging unit.

Inventors:
PARK DONG JIN (KR)
KIM DAE BONG (KR)
KWON YOUNG SANG (KR)
KIM HYUCK RAE (KR)
Application Number:
PCT/KR2023/006027
Publication Date:
November 09, 2023
Filing Date:
May 03, 2023
Export Citation:
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Assignee:
HANWHA VISION CO LTD (KR)
International Classes:
G06T7/571; G03B13/20; G03B13/36; H04N5/77; H04N13/207; H04N13/271; H04N23/67; H04N23/959
Foreign References:
JP2022518532A2022-03-15
KR102191743B12020-12-16
JP6800650B22020-12-16
KR101175196B12012-08-20
KR20160016406A2016-02-15
Attorney, Agent or Firm:
KASAN IP & LAW FIRM (KR)
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