Title:
APPARATUS AND METHOD FOR IMAGE ANALYSIS
Document Type and Number:
WIPO Patent Application WO/2024/063242
Kind Code:
A1
Abstract:
The present invention relates to an apparatus and method for image analysis and, more specifically, to an apparatus and method for image analysis, in which an absolute distance is calculated for a reference map object among map objects included in a depth map, the corresponding absolute distance is applied to other areas of the depth map, and an absolute distance is calculated for the entire area of the depth map. The apparatus for image analysis, according to embodiments of the present invention, comprises: an image capturing unit that generates a captured image; an object detection unit that detects objects in the captured image; a depth map generation unit that generates a depth map for the captured image; and a map analysis unit that selects a reference object from among the detected objects, and calculates an absolute distance for the entire area of the depth map by referring to an absolute distance calculated for a reference map object corresponding to the reference object among map objects included in the depth map.
Inventors:
PARK DONG JIN (KR)
KIM DAE BONG (KR)
KIM DAE BONG (KR)
Application Number:
PCT/KR2023/006885
Publication Date:
March 28, 2024
Filing Date:
May 22, 2023
Export Citation:
Assignee:
HANWHA VISION CO LTD (KR)
International Classes:
G06T7/50; G06T7/11
Foreign References:
| JP2013118472A | 2013-06-13 | |||
| KR20110119933A | 2011-11-03 | |||
| KR20120099713A | 2012-09-11 | |||
| JP2022518532A | 2022-03-15 | |||
| KR102167835B1 | 2020-10-20 |
Attorney, Agent or Firm:
KASAN IP & LAW FIRM (KR)
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