Title:
APPARATUS AND METHOD FOR MEASURING INITIAL POSITION AND SPEED OF OBJECT MOVING ON PLANE
Document Type and Number:
WIPO Patent Application WO/2011/025089
Kind Code:
A1
Abstract:
The present invention relates to an apparatus and a method for measuring kinetic information of an object, and more specifically, to an apparatus and a method for measuring an initial position and the speed of an object moving on the plane. According to the present invention, the apparatus for measuring the initial position and the speed of the object moving on the plane comprises a first measurer, a second measurer, and an operator. The first measurer comprises: a first sensor array which includes a plurality of light receiving sensors arranged to obtain positional information of an object halted on the plane; and a first light source which radiates rays toward the light receiving sensors of the first sensor array. The second measurer measures positional information of the object moving on the plane from at least two points of time. The operator operates the initial position and the speed of the object from the positional information and the time obtained by the first measurer and the second measurer.
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Inventors:
KIM HEA KYUNG (KR)
Application Number:
PCT/KR2009/006391
Publication Date:
March 03, 2011
Filing Date:
November 02, 2009
Export Citation:
Assignee:
DMBH CO LTD (KR)
KIM HEA KYUNG (KR)
KIM HEA KYUNG (KR)
International Classes:
G01P3/68
Foreign References:
| KR100907327B1 | 2009-07-13 | |||
| KR100508272B1 | 2005-08-17 | |||
| KR100553036B1 | 2006-02-16 |
Attorney, Agent or Firm:
DYNE PATENT & LAW FIRM (KR)
특허법인 다인 (KR)
특허법인 다인 (KR)
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