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Title:
APPARATUS AND METHOD FOR MEASURING TEMPERATURE OF OBJECT IN SPACE
Document Type and Number:
WIPO Patent Application WO/2021/219024
Kind Code:
A1
Abstract:
The present application relates to a method and apparatus for acquiring a temperature. The method comprises: receiving a first-type temperature measurement value and a second-type temperature measurement value of an object in a first region; on the basis of the first-type temperature measurement value, the second-type temperature measurement value and a first temperature function, determining a second temperature function that indicates a relationship between the first-type temperature measurement value and the second-type temperature measurement value of the object; acquiring a first-type temperature measurement value of the object in a second region; and acquiring a second-type temperature measurement value of the object in the second region on the basis of the second temperature function.

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Inventors:
LV KAIYUAN (CN)
CHENG CHEN (CN)
GU TIANTIAN (CN)
LI CHUNXIA (CN)
Application Number:
PCT/CN2021/090662
Publication Date:
November 04, 2021
Filing Date:
April 28, 2021
Export Citation:
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Assignee:
FORTIVE SHANGHAI INDUSTRIAL INSTRUMENTATION TECH R&D CO LTD (CN)
International Classes:
G01K13/00
Foreign References:
CN108775975A2018-11-09
CN103674310A2014-03-26
CN105784138A2016-07-20
CN108760082A2018-11-06
JP2002248561A2002-09-03
Attorney, Agent or Firm:
JUN HE LAW OFFICES (CN)
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