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Patent Searching and Data


Title:
AUTOMATIC ANALYSIS DEVICE AND MAINTENANCE ASSISTANCE METHOD
Document Type and Number:
WIPO Patent Application WO/2020/137216
Kind Code:
A1
Abstract:
In order to associate work performed by a user and the operation of a device and to simplify user operations even during complicated maintenance work, this automatic analysis device comprises a measurement device (2) and a control device (3). The control device controls the measurement device. The control device comprises: an input unit (32) that accepts a maintenance work start instruction from a user; a control unit (31) that performs control so as to perform a predetermined first process on a device, in response to the input; an operation unit that performs an operation in response to the control unit process; and a display unit (33) that, after the operation unit has completed the first process, displays a second process that is associated with the first process and is to be performed by the user. After the user has performed the displayed second process, guidance is provided for user maintenance work by further performing a first process and a second process.

Inventors:
NAKAI MARINA (JP)
TAKAKURA TATSUKI (JP)
SASAKI SHUNSUKE (JP)
IMAI KENTA (JP)
Application Number:
PCT/JP2019/044485
Publication Date:
July 02, 2020
Filing Date:
November 13, 2019
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00
Domestic Patent References:
WO2012120755A12012-09-13
Foreign References:
JP2008216173A2008-09-18
JP2018197716A2018-12-13
US20150241458A12015-08-27
JP2013076619A2013-04-25
JP2009181328A2009-08-13
CN107727647A2018-02-23
JP2015092197A2015-05-14
Other References:
See also references of EP 3904886A4
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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