AUTOMATIC ANALYSIS DEVICE - HITACHI HIGH TECH CORP

Title:

AUTOMATIC ANALYSIS DEVICE

Document Type and Number:

WIPO Patent Application WO/2013/150978

Kind Code:

A1

Abstract:

Provided is an automatic analysis device in which measurement can be performed in an efficient manner.This automatic analysis device has a first reagent disc (7) for placing the reagent container housing the reagent used for reaction, a second reagent disc (16), and a reagent container transportation mechanism (17) for transporting the reagent container between the first reagent disc and the second reagent disc. A drive controller (20B) and a determining unit (20A) of a computer (20) transports the reagent container placed on the second reagent disc (16) to the first reagent disc (7) using the reagent container transportation mechanism (17), performs at least the accuracy management measurement from among calibration and accuracy management measurement using the reagent held in the reagent container transported to the first reagent disc (7), and then returns the reagent container to the second reagent disc (16) using the reagent container transportation mechanism (17).

Inventors:

NAKASAWA TAKASHI (JP)
SUZUKI YOSHIHIRO (JP)
ARUGA YOICHI (JP)

Application Number:

PCT/JP2013/059581

Publication Date:

October 10, 2013

Filing Date:

March 29, 2013

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)

International Classes:

G01N35/00

Foreign References:

JP2004271265A	2004-09-30
JP2009168730A	2009-07-30
JPS633265A	1988-01-08
JP2005214683A	2005-08-11
JP2009068993A	2009-04-02
JP2001004637A	2001-01-12
JP2008209338A	2008-09-11
JP2010085250A	2010-04-15
JP2010085249A	2010-04-15

Other References: