Title:
AUTOMATIC ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/116106
Kind Code:
A1
Abstract:
This automatic analysis device is provided with: analysis modules 24, 25, 26 which perform specimen analysis; a display device 30 which displays information relating to maintenance in the device including the analysis modules 24, 25, 26; and an overall management computer 28 which performs control to display global regions 701, 901 in a display screen of the display device 30. The overall management computer 28, when maintenance in the device is being performed in the background and a screen other than a maintenance screen is being displayed on the display device 30, causes notification information to be displayed on a screen including the global regions 701, 901 of the display device 30 if it is necessary to notify the user of the maintenance status.
Inventors:
CHIDA SATORU (JP)
AKUTSU MASASHI (JP)
HA CHIKOOK (JP)
YOKOTSUKA SATOSHI (JP)
AKUTSU MASASHI (JP)
HA CHIKOOK (JP)
YOKOTSUKA SATOSHI (JP)
Application Number:
PCT/JP2019/044472
Publication Date:
June 11, 2020
Filing Date:
November 13, 2019
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00
Domestic Patent References:
| WO2018163745A1 | 2018-09-13 |
Foreign References:
| JP2010249757A | 2010-11-04 | |||
| CN107727647A | 2018-02-23 | |||
| JP2005346013A | 2005-12-15 | |||
| JP2000097946A | 2000-04-07 | |||
| JP2012497757A |
Other References:
See also references of EP 3892999A4
Attorney, Agent or Firm:
KAICHI IP (JP)
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