Title:
AUTOMATIC ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/042808
Kind Code:
A1
Abstract:
This automatic analysis device comprises an analysis unit that analyzes a specimen and a treatment unit that pre-treats the specimen before the analysis, wherein the treatment unit is provided with a temperature adjustment unit that heats or cools the air in the treatment unit, the temperature adjustment unit includes a first reagent temperature adjustment unit and a second reagent temperature adjustment unit, the first reagent temperature adjustment unit is configured to heat or cool a first reagent through contact heat transfer, the second reagent temperature adjustment unit is configured to heat or cool a second reagent through contact heat transfer or forced convection heat transfer, and the first reagent temperature adjustment unit is configured to have a heat exchange rate greater than that of the second reagent temperature adjustment unit. Thus, a plurality of reagents can be adjusted to appropriate temperatures irrespective of the ambient temperature around the automatic analysis device.
Inventors:
FUNAKOSHI SUNAO (JP)
OKUSA TAKENORI (JP)
ISOSHIMA NOBUYUKI (JP)
YOKOYAMA KOKI (JP)
OKUSA TAKENORI (JP)
ISOSHIMA NOBUYUKI (JP)
YOKOYAMA KOKI (JP)
Application Number:
PCT/JP2023/020605
Publication Date:
February 29, 2024
Filing Date:
June 02, 2023
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00
Domestic Patent References:
| WO2020054172A1 | 2020-03-19 | |||
| WO2020235162A1 | 2020-11-26 | |||
| WO2020137081A1 | 2020-07-02 |
Foreign References:
| JP2017026469A | 2017-02-02 |
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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