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Patent Searching and Data


Title:
BIDIRECTIONAL SCATTERING DISTRIBUTION FUNCTION SPECTRAL MEASUREMENT SYSTEM AND MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/004436
Kind Code:
A1
Abstract:
Disclosed is a bidirectional scattering distribution function spectral measurement system, comprising a measurement device (100) and a control device, wherein the measurement device (100) comprises a base (1), a sample table (2), a light source assembly (3), a receiving assembly (4), and a driving assembly, the sample table (2) is provided with a mounting station configured to allow a sample to be measured to be mounted thereon, and is rotatably mounted on the base (1) in a transverse direction, the light source assembly (3) comprises a light source probe (31), the light source probe (31) is movably mounted on the base (1) along a first spherical surface (1a), the receiving assembly (4) comprises a receiving probe (41), the receiving probe (41) is movably mounted on the base (1) along a second spherical surface (1b), and the driving assembly enables the measurement device (100) to have a reflected spectrum measurement state in which the light source probe (31) and the receiving probe (41) are located on the same side of the mounting station and a transmitted spectrum measurement state in which the light source probe (31) and the receiving probe (41) are located on different sides of the mounting station. Further provided is the measurement device (100).

Inventors:
ZHOU WENWEN (CN)
JIANG ERLONG (CN)
Application Number:
PCT/CN2020/100474
Publication Date:
January 14, 2021
Filing Date:
July 06, 2020
Export Citation:
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Assignee:
LISEN OPTICS SHENZHEN CO LTD (CN)
International Classes:
G01N21/47; G01N21/01; G01N21/59
Foreign References:
CN110208218A2019-09-06
CN102854149A2013-01-02
CN207908363U2018-09-25
CN104458655A2015-03-25
CN104677859A2015-06-03
US20120253749A12012-10-04
US20070216905A12007-09-20
Attorney, Agent or Firm:
SHENZHEN CENFO INNOVATIVE INTELLECTUAL PROPERTY CO., LTD. (CN)
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