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Title:
CALIBRATION METHOD FOR DELAY TIME NONLINEARITY OF OPTICAL DELAY SYSTEM
Document Type and Number:
WIPO Patent Application WO/2024/036885
Kind Code:
A1
Abstract:
A calibration method for delay time (ti) nonlinearity of an optical delay system (14), comprising: first building a polarization Michelson interference measurement system, wherein a rotary optical delay system (14) comprises a rotary prism (10) and a rotary displacement platform (11), and the rotary prism (10) is driven by the rotary displacement platform (11) to rotate horizontally around the central axis; the rotary displacement platform (11) drives the rotary prism (10) to rotate at a rotation interval (β), and a corresponding interference fringe image in a CCD camera (13) is collected in an angle change process of a single prismatic surface of the rotary prism (10); obtaining an actual delay time (ti) of a rotation angle (γi) of the single prismatic surface of the rotary prism (10) in the rotary optical delay system (14) on the basis of the interference fringe image; using the least squares method to fit a relationship between the rotation angle (γi) of the rotary prism (10) and the actual delay time (ti); and on the basis of the least squares fitting relationship, establishing a sensitivity (ak) relationship between a fitted delay time (ti') of the rotary prism (10) in the rotary optical delay system (14) and the rotation angle (γi) of the rotary prism (10). The calibration of the delay time (ti) nonlinearity of the rotary optical delay system (14) and the type selection of an encoder of the rotary optical delay system (14) are achieved.

Inventors:
XUE JUNWEN (CN)
LI LIJUAN (CN)
ZHU LILI (CN)
REN JIAOJIAO (CN)
ZHANG DANDAN (CN)
GU JIAN (CN)
LIANG WEI (CN)
ZHANG JIYANG (CN)
CHEN QI (CN)
MU DA (CN)
KONG SHIYUAN (CN)
Application Number:
PCT/CN2023/073108
Publication Date:
February 22, 2024
Filing Date:
January 19, 2023
Export Citation:
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Assignee:
UNIV CHANGCHUN SCIENCE & TECH (CN)
ZHONGSHAN INSTITUTE OF CHANGCHUN UNIV OF SCIENCE AND TECHNOLOGY (CN)
CHENGDU LOONG OPTOELECTRONIC TECH CO LTD (CN)
International Classes:
G06F17/18; G01J9/02
Foreign References:
CN115420388A2022-12-02
DE102017100850A12018-07-19
JPH10339604A1998-12-22
JPH10232105A1998-09-02
CN105932531A2016-09-07
US5811655A1998-09-22
CN202210986603A2022-08-17
Other References:
CHENG, SHUANG: "MASTER'S THESES OF CHANGCHUN UNIVERSITY OF SCIENCE AND TECHNOLOGY,", 1 June 2021, CHANGCHUN UNIVERSITY OF SCIENCE AND TECHNOLOGY, CN, article CHENG, SHUANG: "Research on Key Technology for High-Resolution Terahertz Time-Domain Spectroscopy Detection", pages: 1 - 50
P. HASCHBERGER ET AL.: "Michelson Interferometer with a Rotating Retroreflector: Investigations on Special Features", INFRARED PHYSICS, vol. 31, no. 4, 31 August 1991 (1991-08-31), pages 351 - 362, XP024448070, ISSN: 0020-0891, DOI: 10.1016/0020-0891(91)90008-4
Attorney, Agent or Firm:
UNI-INTEL PATENT AND TRADEMARK LAW FIRM (CN)
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