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Patent Searching and Data


Title:
CAPACITANCE MEASURING CIRCUIT, AND CAPACITANCE DISPLACEMENT METER
Document Type and Number:
WIPO Patent Application WO/2019/216274
Kind Code:
A1
Abstract:
This capacitance measuring circuit measures a capacitance formed between a first electrical conductor to which an alternating current signal is input and a second electrical conductor. The capacitance measuring circuit is provided with: a signal detecting means which includes an amplifier having an input and an output, and a negative feedback portion that includes a feedback capacitance and that applies negative feedback from the output of the amplifier to the input of the amplifier, wherein the input to the amplifier is connected to the second electrical conductor and is virtually grounded by means of the negative feedback portion, and the signal detecting means outputs an alternating current signal having an amplitude in a functional relationship with the capacitance; and a measuring means which is connected to the output of the signal detecting means and has at least the function of measuring the amplitude of the alternating current signal output of the signal detecting means.

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Inventors:
SOBUKAWA SHINGO (JP)
MURASE KEITA (JP)
KAMIMURA TAKEHITO (JP)
Application Number:
PCT/JP2019/017984
Publication Date:
November 14, 2019
Filing Date:
April 26, 2019
Export Citation:
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Assignee:
NF CORP (JP)
International Classes:
G01R27/26; G01B7/00
Domestic Patent References:
WO2011024576A12011-03-03
WO2018062956A12018-04-05
Foreign References:
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Attorney, Agent or Firm:
RYUKA IP LAW FIRM (JP)
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