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Title:
CAPILLARY FOCUSING MICROBEAM X-RAY DIFFRACTOMETER
Document Type and Number:
WIPO Patent Application WO/2020/199689
Kind Code:
A1
Abstract:
A capillary focusing microbeam X-ray diffractometer, comprising: an X-ray source system (1), an X-ray filter (9), a capillary convergence X-ray lens (10), a receiving slit (11), a three-dimensional sample table (12), a goniometer (13), an X-ray detector (6), an electronics system (7), a control system (14), and a computer (8). A sample is placed on the sample table (12). The X-ray source system (1), the X-ray filter (9), and the capillary convergence X-ray lens (10) are located on the same straight line and are mounted at one side of the goniometer (13). The receiving slit (11) and the X-ray detector (6) are located on the same straight line and are mounted at the other side of the goniometer (13). The X-ray detector (6) is electrically connected to the electronics system (7) and the computer (8) in sequence. The control system (14) is respectively electrically connected to the three-dimensional sample table (12), the goniometer (13), and the computer (8). The diffractometer has two analysis modes of micro-area X-ray diffraction analysis and micro-area energy dispersion X-ray fluorescence analysis. A phase structure of a small sample or a sample micro-area can be measured, and distribution of phases or elements can be detected by means of two-dimensional continuous scanning.

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Inventors:
CHENG LIN (CN)
JIANG QILI (CN)
DUAN ZEMING (CN)
Application Number:
PCT/CN2019/130355
Publication Date:
October 08, 2020
Filing Date:
December 31, 2019
Export Citation:
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Assignee:
UNIV BEIJING NORMAL (CN)
International Classes:
G01N23/20008; G01N23/223
Foreign References:
CN109991253A2019-07-09
CN1504744A2004-06-16
CN106342216B2010-11-10
CN108709898A2018-10-26
CN102135506A2011-07-27
CN201368856Y2009-12-23
JP2007309649A2007-11-29
Attorney, Agent or Firm:
BEIJING HESHINIP INTELLECTUAL PROPERTY OFFICE (CN)
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