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Patent Searching and Data


Title:
CELL DETERIORATION DIAGNOSIS SYSTEM, DIAGNOSIS PROCESSING DEVICE, MEASUREMENT DEVICE, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/255557
Kind Code:
A1
Abstract:
A cell deterioration diagnosis system according to the present invention includes: a measurement device which measures cell state data indicating electrical characteristics of a secondary cell; and a diagnosis processing device which diagnoses a deterioration state of the secondary cell. The diagnosis processing device stores cell deterioration information for the secondary cell ahead of time, references the cell deterioration information when the cell state data of the secondary cell is received from the measurement device, and computes the deterioration state, of the secondary cell, corresponding to the received cell state data. The diagnosis processing device transmits, to the measurement device, a diagnosis result indicating the computed deterioration state of the secondary cell.

Inventors:
MORI TAKUMI (JP)
HOTTA AKINORI (JP)
MIYASHITA NATSUKI (JP)
Application Number:
PCT/JP2020/017355
Publication Date:
December 24, 2020
Filing Date:
April 22, 2020
Export Citation:
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Assignee:
HIOKI ELECTRIC WORKS (JP)
International Classes:
H01M10/42; G01R31/367; G01R31/389; G01R31/392; H01M10/48; H02J7/00
Domestic Patent References:
WO2016071941A12016-05-12
WO2015198631A12015-12-30
WO2019181702A12019-09-26
Foreign References:
JP2018128769A2018-08-16
JP2017194468A2017-10-26
JP2019090648A2019-06-13
JP2019015664A2019-01-31
JP2014072932A2014-04-21
JP2016090346A2016-05-23
Attorney, Agent or Firm:
GOTOH & PARTNERS (JP)
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