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Title:
CONFIGURATION BITSTREAM-BASED FPGA FAULT INJECTION COMPOSITE MODEL AND FAULT INJECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/153131
Kind Code:
A1
Abstract:
Provided are a configuration bitstream-based FPGA fault injection composite model and a fault injection system. The composite model comprises a spatial traverse model, an environment reconstruction model, a fixed point accuracy model, a resource-oriented model and a multiple bit upset model. The respective models acquire, from a configuration bitstream layer of an FPGA, and according to different research objectives and different circuit designs, address information of a corresponding target configuration bit, and perform, according to the same, single event upset fault injection on an FPGA circuit. The composite model of the present invention enables evaluation of sensitivity of an FPGA circuit with respect to single event upset effect to be performed from a whole-circuit perspective or a local perspective, or according to various factors, such as different research objectives and different types of circuits. The present invention addresses an issue in which existing fault injection models have a limited range of application and utilization when performing targeted single event upset fault injection on certain configuration bits. Compared with a conventional method in which single event upset fault injection is performed on all configuration bits, the present invention has greatly improved execution efficiency.

Inventors:
CHEN LEI (CN)
YU TINGTING (CN)
ZHOU JING (CN)
WANG SHUO (CN)
LI XUEWU (CN)
Application Number:
PCT/CN2017/113268
Publication Date:
August 30, 2018
Filing Date:
November 28, 2017
Export Citation:
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Assignee:
BEIJING MXTRONICS CORP (CN)
BEIJING MICROELECTRONICS TECH INSTITUTE (CN)
International Classes:
G06F11/22
Foreign References:
CN107092539A2017-08-25
CN106124970A2016-11-16
CN104317995A2015-01-28
CN104598699A2015-05-06
CN102521467A2012-06-27
Attorney, Agent or Firm:
PATENT AGENT OF CHINA AEROSPACE TECHNOLOGY (CN)
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