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Title:
CONTRAST SENSITIVITY INSPECTION DEVICE, OPTICAL ELEMENT EVALUATION DEVICE, CONTRAST SENSITIVITY INSPECTION METHOD, AND OPTICAL ELEMENT EVALUATION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/042869
Kind Code:
A1
Abstract:
Provided is a contrast sensitivity inspection device for which a desired illumination environment can be easily set, which can inspect contrast sensitivity with high accuracy in a simple manner, and which is smaller than conventional devices. This contrast sensitivity inspection device is characterized by comprising: an illumination unit that emits illumination light that sets a predetermined illumination environment as the field of view of a subject; a visual target presentation unit that is placed in the field of view of the subject and that presents multiple visual targets with different contrasts in sequence by switching the visual targets; a response time measurement unit that measures the response time from presentation of each visual target to recognition of the visual target by the subject when the illumination light is emitted; and a casing that accommodates the illumination unit, the visual target presentation unit, and the response time measurement unit.

Inventors:
HIGASHIKAWA TAKUJI (JP)
MATSUU KUNIYUKI (JP)
WADA MIKIO (JP)
TOMIYAMA TERUYOSHI (JP)
Application Number:
PCT/JP2022/034482
Publication Date:
March 23, 2023
Filing Date:
September 14, 2022
Export Citation:
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Assignee:
NAC IMAGE TECH INC (JP)
HOPNIC LABORATORY CO LTD (JP)
International Classes:
A61B3/06; A61B3/11; A61B3/113; A61B5/16
Domestic Patent References:
WO2017022757A12017-02-09
WO2002062208A12002-08-15
Foreign References:
US20170049316A12017-02-23
JP2003199712A2003-07-15
JP2003225205A2003-08-12
JP2014147427A2014-08-21
JP2011161122A2011-08-25
JP2007020919A2007-02-01
JP2014087660A2014-05-15
JP2009240638A2009-10-22
Attorney, Agent or Firm:
ARAKI Yoshiyuki (JP)
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