Title:
CONTROL SYSTEM, SUPPORT DEVICE, AND LABELING METHOD
Document Type and Number:
WIPO Patent Application WO/2022/137580
Kind Code:
A1
Abstract:
This control system includes: a control computation unit that executes control computation for controlling an object to be controlled; an abnormality detection unit that refers to a model and detects abnormalities in the object to be controlled on the basis of information collected from the object to be controlled; an image collection unit that collects images in which items related to the object of abnormality detection are captured; a user interface unit that makes a time-related association between information collected from the object to be controlled and the captured image, outputs the result of the association, and accepts designation of a label; and a generation unit that adds the designated label to the information collected from the object to be controlled, whereby training data for configuring the model is generated.
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Inventors:
KAWANOUE SHINSUKE (JP)
TSUCHIKAWA KENTO (JP)
TSUCHIKAWA KENTO (JP)
Application Number:
PCT/JP2021/009572
Publication Date:
June 30, 2022
Filing Date:
March 10, 2021
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G05B23/02
Foreign References:
| JP2020086481A | 2020-06-04 | |||
| JP6164020B2 | 2017-07-19 | |||
| JP2020101904A | 2020-07-02 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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