Title:
DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2023/058609
Kind Code:
A1
Abstract:
A defect analysis device 100 configured so as to comprise: a storage unit 120 which stores information about the initiation and completion of an analysis, the initiation of each loop, and the function call relationships in the source code of software to be analyzed; and a control unit 110 which sets the loop including the analysis intitiation point among said loops as the origin, and while progressing toward the analysis completion point, performs symbolic execution in parallel for each variable range stipulated by the source code for each loop of said loop group according to the call source direction in a loop group series in the function call relationship, and outputs the area where and conditions under which a defect was detected.
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Inventors:
KAWAKAMI MASUMI (JP)
SUZUKI YASUFUMI (JP)
YASUDA KAZUYA (JP)
SUZUKI YASUFUMI (JP)
YASUDA KAZUYA (JP)
Application Number:
PCT/JP2022/037005
Publication Date:
April 13, 2023
Filing Date:
October 03, 2022
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G06F11/36
Foreign References:
| JP2018190219A | 2018-11-29 | |||
| JP2012099107A | 2012-05-24 | |||
| US20210019250A1 | 2021-01-21 |
Other References:
JIBIKI HISASHI, HARADA KENICHI: "A Method for Generation of Declarative Specification from a Program, and Application to Source Code Reading Support.", PROCEEDINGS OF THE 50TH ANNUAL CONFERENCE OF THE INFORMATION PROCESSING SOCIETY OF JAPAN; SOFTWARE ENGINEERING; MARCH 15 TO 17, 1995, INFORMATION PROCESSING SOCIETY OF JAPAN, JP, 15 March 1995 (1995-03-15) - 17 March 1995 (1995-03-17), JP, pages 5 - 5-288, XP009547164
Attorney, Agent or Firm:
ISSHIKI PATENT & TRADEMARK FIRM (JP)
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