Title:
DEFECT DETECTING DEVICE, DEFECT DETECTING METHOD, AND COMPUTER-READABLE RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2018/043251
Kind Code:
A1
Abstract:
Provided are a defect detecting device, a defect detecting method and a program capable of suppressing an increase in cost and suppressing the occurrence of erroneous determinations in a defect determination of a structure.
A defect detecting device 10 is provided with: an overall displacement measuring unit 11 which, on the basis of observed data output from an observation device which observes a target object, measures an overall movement displacement of the target object relative to an observation point as an overall displacement at set time intervals; a specific segment detecting unit 12 which detects a specific segment during which the measured overall displacement is in a specific state, from within a period during which observation is being carried out; a partial displacement measuring unit 13 which, on the basis of the observed data, measures displacements of a plurality of points established on the target object, during the detected specific segment, as partial displacements; and a defect detecting unit 14 which obtains at least one of a change over time and a spatial distribution of the partial displacements, and detects a defect in the target object on the basis of at least one of the obtained change over time and the spatial distribution of the partial displacements.
Inventors:
TAKADA JUN (JP)
Application Number:
PCT/JP2017/030159
Publication Date:
March 08, 2018
Filing Date:
August 23, 2017
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01B21/00; G01B21/32; G01M99/00
Foreign References:
| JP2015102363A | 2015-06-04 | |||
| JP2016057102A | 2016-04-21 | |||
| JP2016084579A | 2016-05-19 | |||
| JP2013040820A | 2013-02-28 | |||
| JP2013007624A | 2013-01-10 | |||
| US20160171309A1 | 2016-06-16 |
Attorney, Agent or Firm:
SHIMOSAKA Naoki (JP)
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