Title:
DELAY TIME MEASUREMENT DEVICE, DELAY TIME MEASUREMENT METHOD AND DELAY TIME MEASUREMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/233606
Kind Code:
A1
Abstract:
This delay time measurement device comprises: a first delay time measurement unit (11) that measures a round-trip delay time occurring between the device and a start node; a second delay time measurement unit (12) that measures a round-trip delay time occurring between the device and a destination node; a third delay time measurement unit that measures a forward delay time of a loop from the device through a measurement section back to the device; a one-way average delay time calculation unit (14) that calculates a one-way average delay time on the basis of the round-trip delay times measured by the first delay time measurement unit (11) and the second delay time measurement unit; and a delay time calculation unit (15) that subtracts the one-way average delay time from the forward delay time to calculate a forward delay time of the measurement section.
Inventors:
KAMIENOO KAZUMA (JP)
TAKAHASHI KEN (JP)
KIHARA TAKU (JP)
TAKAHASHI KEN (JP)
KIHARA TAKU (JP)
Application Number:
PCT/JP2022/022410
Publication Date:
December 07, 2023
Filing Date:
June 02, 2022
Export Citation:
Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
H04L43/0852
Foreign References:
| US20150023179A1 | 2015-01-22 |
Attorney, Agent or Firm:
ISONO INTERNATIONAL PATENT OFFICE, P.C. (JP)
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