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Title:
DEPTH MEASUREMENT APPARATUS AND DISTANCE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2021/008209
Kind Code:
A1
Abstract:
Disclosed are a depth measurement apparatus and a distance measurement method. The depth measurement apparatus (10, 40) comprises: a light emission module (11, 41), which includes a light source (111) and a patterned optical element (112), wherein the light source (111) is used for emitting a light beam, the amplitude of which is modulated, on a time sequence, and the patterned optical element (112) is used for receiving the light beam and then emitting a structured light beam to a target object (20); a TOF image sensor (121), which includes at least one pixel (51), wherein the pixel (51) is used for receiving the structured light beam reflected by the target object (20) and forming an electrical signal; and a control and processing circuit (13, 43), which receives the electrical signal, calculates intensity information of the reflected structured light beam to form a structured light pattern, and calculates a depth image of the target object (20) by using the structured light pattern. The TOF image sensor (121) is combined with the structured light source, amplitude modulation is used at an emission end, and multi-tap pixel collection is used at a receiving end, thereby achieving a depth measurement method, which is hard to achieve by means of a traditional solution, capable of resisting ambient light interference.

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Inventors:
WANG ZHAOMIN (CN)
WU WANDUO (CN)
Application Number:
PCT/CN2020/089758
Publication Date:
January 21, 2021
Filing Date:
May 12, 2020
Export Citation:
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Assignee:
SHENZHEN ORBBEC CO LTD (CN)
International Classes:
G01S7/481; G01S17/08
Domestic Patent References:
WO2016118310A12016-07-28
Foreign References:
CN110333501A2019-10-15
CN109343070A2019-02-15
CN107067428A2017-08-18
CN109283508A2019-01-29
CN108490632A2018-09-04
CN108881717A2018-11-23
CN102694998A2012-09-26
Attorney, Agent or Firm:
CHINA TRUER IP (CN)
Download PDF:
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