Title:
DEVICE AND METHOD FOR MEASURING ELECTRIC FIELD BY USING MOS CAPACITOR
Document Type and Number:
WIPO Patent Application WO/2016/114461
Kind Code:
A1
Abstract:
One embodiment provides a technique of adjusting a gate voltage to be applied to at least one MOS capacitor and an amount of electric charges to be stored in the MOS capacitor so as to determine sensitivity of a change in the amount of electric charges stored in the MOS capacitor, and exposing the MOS capacitor to an electric filed for a predetermined amount of time and then reading an electron inflow or outflow result due to the electric field so as to interpret the intensity and the direction of the electric field, thereby measuring the intensity and the direction of the electric field.
Inventors:
MIN SANG LYUL (KR)
LEE YONG HUN (KR)
LEE YONG HUN (KR)
Application Number:
PCT/KR2015/007103
Publication Date:
July 21, 2016
Filing Date:
July 09, 2015
Export Citation:
Assignee:
SNU R&DB FOUNDATION (KR)
International Classes:
G01R29/12; G01R29/08
Foreign References:
| JPH09129694A | 1997-05-16 | |||
| US4866645A | 1989-09-12 | |||
| US20140288898A1 | 2014-09-25 | |||
| US20120194799A1 | 2012-08-02 | |||
| JP2005216993A | 2005-08-11 |
Attorney, Agent or Firm:
MUHANN PATENT & LAW FIRM (KR)
특허법인 무한 (KR)
특허법인 무한 (KR)
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