DEVICE AND METHOD FOR MEASURING THREE-DIMENSIONAL SHAPE

WIPO Patent Application WO/2015/105360

A1

The present invention relates to a method for measuring a three-dimensional shape. The method for measuring a three-dimensional shape according to an embodiment of the present invention comprises the steps of: forming a pattern on a light irradiated to an object from a light source unit installed in an electronic device by a pattern unit installed in the electronic device; generating image data by photographing the object to which the light on which the pattern is formed is irradiated by a camera unit installed in the electronic device; generating phase data for the object using the image data, and generating, using the phase data by a data generation unit, feature value data for a feature value of the object; and determining, by a determination unit, whether the feature value data is identical to pre-stored reference value data using the feature value data and the pre-stored reference value data.

WO/2010/024112	METHOD OF AND APPARATUS FOR ACQUIRING AN IMAGE
WO/2006/054425	THREE-DIMENSIONAL MEASURING INSTRUMENT, THREE-DIMENSIONAL MEASURING METHOD, AND THREE-DIMENSIONAL MEASURING PROGRAM
WO/2003/017184	DEVICE AND METHOD FOR RECOGNITION OF OPTICAL MARKERS

LEE HYUNKI (KR)
KHO KWANGILL (KR)

PCT/KR2015/000210

July 16, 2015

January 08, 2015

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KOH YOUNG TECH INC (KR)

G06V10/145

JP2001351098A	2001-12-21
KR200399917Y1	2005-11-01
JP2013022338A	2013-02-04
KR20100066192A	2010-06-17
KR20050020327A	2005-03-04

RYU, Sungwon et al. (KR)
유성원 (KR)

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