Title:
DIELECTRIC CHARACTERISTIC MEASUREMENT METHOD AND DIELECTRIC CHARACTERISTIC MEASUREMENT SYSTEM USING OPEN RESONATOR
Document Type and Number:
WIPO Patent Application WO/2023/095525
Kind Code:
A1
Abstract:
According to the present invention, a dielectric characteristic measurement method involves a step in which a sample for which dielectric characteristics are to be measured is installed at an open resonator, and the position of the sample is adjusted. Said step includes a first measurement step and second and subsequent measurement steps. The first measurement step involves performing a first resonance measurement by sweeping in a prescribed sweep frequency range as many times as there are first measurement points. The second and subsequent measurement steps involve a plurality of resonance measurements that follow the first resonance measurement and are each performed by sweeping in a sweep frequency range that has been set on the basis of the preceding resonance measurement as many times as there are second measurement points, which are fewer than the first measurement points, the sweep frequency range of a second resonance measurement of the plurality of resonance measurements being set on the basis of the first resonance measurement.
Inventors:
YANAGIMOTO YOSHIYUKI (JP)
HATTORI ATSUSHI (JP)
HATTORI ATSUSHI (JP)
Application Number:
PCT/JP2022/039878
Publication Date:
June 01, 2023
Filing Date:
October 26, 2022
Export Citation:
Assignee:
EM LABS INC (JP)
International Classes:
G01N22/00
Foreign References:
| JP2021039039A | 2021-03-11 | |||
| US6864690B1 | 2005-03-08 | |||
| JP2012047548A | 2012-03-08 | |||
| JPH05142273A | 1993-06-08 | |||
| JPH09205319A | 1997-08-05 | |||
| CN211878079U | 2020-11-06 | |||
| US6101015A | 2000-08-08 | |||
| JP2021181963A | 2021-11-25 | |||
| JP2022078723A | 2022-05-25 | |||
| JPS4924341A | 1974-03-04 | |||
| JP2008170432A | 2008-07-24 |
Other References:
KOMIYAMA B., KIYOKAWA M., MATSUI T.: "OPEN RESONATOR FOR PRECISION DIELECTRIC MEASUREMENTS IN THE 100 GHZ BAND.", IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, IEEE, USA, vol. 39., no. 10., 1 October 1991 (1991-10-01), USA, pages 1792 - 1796., XP000227253, ISSN: 0018-9480, DOI: 10.1109/22.88556
W.F.P. CHAN ; B. CHAMBERS: "Measurement of the Complex Permittivity of Curved Dielectric Radome Specimens using an Open Resonator", MICROWAVE CONFERENCE, 1986. 16TH EUROPEAN, IEEE, PISCATAWAY, NJ, USA, 8 September 1986 (1986-09-08), Piscataway, NJ, USA , pages 796 - 801, XP031603584
A. L. CULLENP. K. YU: "The accurate measurement of permittivity by means of open resonator", PROC. R. SOC. LOND. A., vol. 325, 1971, pages 493 - 509, XP009548294, DOI: 10.1098/rspa.1971.0181
W.F.P. CHAN ; B. CHAMBERS: "Measurement of the Complex Permittivity of Curved Dielectric Radome Specimens using an Open Resonator", MICROWAVE CONFERENCE, 1986. 16TH EUROPEAN, IEEE, PISCATAWAY, NJ, USA, 8 September 1986 (1986-09-08), Piscataway, NJ, USA , pages 796 - 801, XP031603584
A. L. CULLENP. K. YU: "The accurate measurement of permittivity by means of open resonator", PROC. R. SOC. LOND. A., vol. 325, 1971, pages 493 - 509, XP009548294, DOI: 10.1098/rspa.1971.0181
Attorney, Agent or Firm:
KISHIMOTO Yasuhiro (JP)
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