ESD PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE PROVIDED WITH SAME

WIPO Patent Application WO/2011/108445

A1

Disclosed is an ESD protection circuit, which has ESD protection functions to the circuits from a low withstand voltage circuit to a high withstand voltage circuit, even with a small layout area. In the ESD protection circuit, an ESD protection element (13) is provided between a node (NL), which is connected to a power supply terminal (VCC_l) that outputs a low voltage, and a grounding line, an ESD protection element (12) is provided between a node (NM), which is connected to a power supply terminal (VCC_m) that outputs an intermediate voltage, and the node (NL), and an ESD protection element (11) is provided between a node (NH), which is connected to a power supply terminal (VCC_h) that outputs a high voltage, and the node (NM). A low withstand voltage element to be protected (18), an intermediate withstand voltage element to be protected (17), and a high withstand voltage element to be protected (16) are respectively connected between a grounding line (VSS) and respective nodes (NL, NM, NH). ESD protection of the element to be protected (16) is performed by means of the ESD protection elements (11, 12, 13), ESD protection of the element to be protected (17) is performed by means of the ESD protection elements (12, 13), and ESD protection of the element to be protected (18) is performed by means of an ESD protection element (13).

FUKUMI MASAYUKI

PCT/JP2011/054238

September 09, 2011

February 25, 2011

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SHARP KK (JP)
FUKUMI MASAYUKI

H01L21/822; H01L21/8234; H01L27/04; H01L27/06; H01L27/088

JP2009503812A	2009-01-29
JPH0714984A	1995-01-17
JPH07235604A	1995-09-05
JPH11103021A	1999-04-13

MASAKI YOSHIFUMI (JP)
Yoshifumi Masaki (JP)

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