Title:
EXAMINATION SYSTEM AND ENTRY MANAGEMENT FACILITY
Document Type and Number:
WIPO Patent Application WO/2018/003162
Kind Code:
A1
Abstract:
An examination system having a high throughput is provided.
An aspect of the present invention is an examination system provided with: a first examination device for examining an object carried by a person; and a second examination device for examining baggage which is associated with the person and is not carried by the person. The system is characterized in that if the object is normal on the basis of first information from the first examination device, and the baggage is normal on the basis of second information from the second examination device, the system outputs third information for guiding the person to a first place, and if the object is abnormal on the basis of the first information from the first examination device, or the baggage is abnormal on the basis of the second information from the second examination device, the system outputs fourth information for guiding the person to a second place different from the first place.
Inventors:
MATSUBARA DAISUKE (JP)
SHIBUYA SHINJI (JP)
AKIRA NAOTO (JP)
NUKUGA NOBUO (JP)
SHIBUYA SHINJI (JP)
AKIRA NAOTO (JP)
NUKUGA NOBUO (JP)
Application Number:
PCT/JP2017/005686
Publication Date:
January 04, 2018
Filing Date:
February 16, 2017
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G07B15/00; G07C9/00
Foreign References:
| US20050024199A1 | 2005-02-03 | |||
| US20020172324A1 | 2002-11-21 |
Attorney, Agent or Firm:
SEIRYO I.P.C. (JP)
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