Title:
FACILITY INSPECTION ASSISTANCE SYSTEM, FACILITY INSPECTION ASSISTANCE METHOD, AND RECORDING MEDIUM HAVING FACILITY INSPECTION ASSISTANCE PROGRAM STORED THEREON
Document Type and Number:
WIPO Patent Application WO/2022/123628
Kind Code:
A1
Abstract:
A facility inspection assistance system 50 is provided with: an acquisition unit 51 which acquires abnormality occurrence information 600 representing an abnormality occurrence status regarding each of a plurality of facilities 60; a determination unit 52 which determines priorities 521 regarding the inspection of the facilities 60 on the basis of the abnormality occurrence information 600 and attributes 520 of the facilities; and a generation unit 53 which generates inspection work information 530 representing inspection work for the facilities 60 on the basis of the priorities 521 and the attributes 520 of the facilities. Thus the facility inspection assistance system 50 achieves the determination of inspection work based on appropriate response policies for failures occurring in the facilities 60.
Inventors:
ICHIHARA EIJI (JP)
ENDO TSUTOMU (JP)
MORITA KOICHIRO (JP)
ENDO TSUTOMU (JP)
MORITA KOICHIRO (JP)
Application Number:
PCT/JP2020/045481
Publication Date:
June 16, 2022
Filing Date:
December 07, 2020
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06Q10/00; G06Q50/06
Domestic Patent References:
| WO2013115109A1 | 2013-08-08 |
Foreign References:
| JP2015042086A | 2015-03-02 | |||
| JP2020024657A | 2020-02-13 | |||
| JP2003034953A | 2003-02-07 | |||
| JP2005162212A | 2005-06-23 | |||
| CN109473970A | 2019-03-15 |
Attorney, Agent or Firm:
KITAJIMA Hiroshi et al. (JP)
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