Title:
FLUORESCENT X-RAY ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/210136
Kind Code:
A1
Abstract:
A fluorescent X-ray analysis device (10) includes: a sample stage (2); an X-ray tube (7) that is configured so as to radiate excitation X-rays toward the sample stage (2); a detector (8) that detects fluorescent X-rays emitted from a sample on the sample stage; and a control device (14) that controls the X-ray tube (7) and the detector (8). When creating a calibration curve by radiating the excitation X-rays on a standard sample from the X-ray tube (7), the control device (14) issues a warning in the case in which the values of IR/IC obtained with respect to the standard sample fall outside a reference range, assuming that the intensity of X-rays that undergo Rayleigh scattering is IR and the intensity of X-rays that undergo Compton scattering is IC, said X-rays being the results of the sample (S) on the sample stage (2) scattering fluorescent X-rays emitted from the X-ray tube (7) with respect to an X-ray tube bulb target material.
Inventors:
SUZUKI KEIJIRO (JP)
Application Number:
PCT/JP2023/006692
Publication Date:
November 02, 2023
Filing Date:
February 24, 2023
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N23/223
Domestic Patent References:
| WO2015056305A1 | 2015-04-23 |
Foreign References:
| JP2017020924A | 2017-01-26 | |||
| JP2000227403A | 2000-08-15 | |||
| JP2013040867A | 2013-02-28 | |||
| KR20050112376A | 2005-11-30 | |||
| US20190227009A1 | 2019-07-25 | |||
| JP2000193615A | 2000-07-14 | |||
| JP2003161709A | 2003-06-06 | |||
| JPH03110475A | 1991-05-10 | |||
| JP2011099749A | 2011-05-19 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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