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Patent Searching and Data


Title:
HATCHING EGG INSPECTION SYSTEM AND HATCHING EGG INSPECTION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/101139
Kind Code:
A1
Abstract:
The present invention sorts hatching eggs from various perspectives at high speed and non-invasively, and is provided with measurement units (light irradiation unit 2, light detection unit 3) for measuring state information indicating a state of a hatching egg, a recording unit 4 for correlating a plurality of days of state information obtained by the measurement units 2, 3 with each individual hatching egg and recording the state information, and a hatching egg sorting unit 5 for sorting hatching eggs on the basis of records correlated with each individual hatching egg of the plurality of days of state information recorded by the recording unit 4.

Inventors:
FUJITANI SHINICHI (JP)
Application Number:
PCT/JP2017/041957
Publication Date:
June 07, 2018
Filing Date:
November 22, 2017
Export Citation:
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Assignee:
NABEL CO LTD (JP)
International Classes:
G01N21/17; A01K43/00; G01N21/35; G01N21/49; G01N21/85
Domestic Patent References:
WO2015195746A12015-12-23
Foreign References:
JP2004177309A2004-06-24
JP2004520068A2004-07-08
JP2005532046A2005-10-27
JP2008516601A2008-05-22
CN104316473A2015-01-28
US9179651B22015-11-10
JP2011106892A2011-06-02
JP2017227471A2017-12-28
Attorney, Agent or Firm:
NISHIMURA, Ryuhei (JP)
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