Title:
IC INSPECTION SOCKET
Document Type and Number:
WIPO Patent Application WO/2021/084842
Kind Code:
A1
Abstract:
An IC inspection socket (10) includes: a pin block (30) having a contact probe array (60); a guiding plate (40) that guides an inspection-target IC package to the contact probe array (60); and a cover (50) that presses down the guiding plate by means of engagement of an engaging section that engages with the pin block (30). The pin block (30) has: a support section (70) that supports the guiding plate (40) in an attachable/detachable manner; and an engaged section (36) with which the engaging section engages as a result of the cover (50) moving in a sliding manner on the supported guiding plate (40).
Inventors:
AMADA KOHEI (JP)
MATSUI YUKI (JP)
MATSUI YUKI (JP)
Application Number:
PCT/JP2020/030591
Publication Date:
May 06, 2021
Filing Date:
August 11, 2020
Export Citation:
Assignee:
YOKOWO SEISAKUSHO KK (JP)
International Classes:
H01R33/76; G01R31/26
Foreign References:
| JP2012015024A | 2012-01-19 | |||
| JP2000133398A | 2000-05-12 | |||
| JP2004006170A | 2004-01-08 | |||
| JP2017208306A | 2017-11-24 |
Attorney, Agent or Firm:
KURODA Yasushi et al. (JP)
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