Title:
IMAGE ANALYSIS SYSTEM AND IMAGE ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2022/064631
Kind Code:
A1
Abstract:
This invention provides an image analysis system (10) which includes: a plurality of image analysis units (11); a selection unit (12) that selects at least one of the plurality of image analysis units (11); an analysis control unit (15) that causes the selected image analysis unit (11) to analyze an image specified by a user; and an output unit (17) that outputs the image analysis results.
Inventors:
LIU JIANQUAN (JP)
SASAKI YOUHEI (JP)
NAMIKI YUTA (JP)
SASAKI YOUHEI (JP)
NAMIKI YUTA (JP)
Application Number:
PCT/JP2020/036222
Publication Date:
March 31, 2022
Filing Date:
September 25, 2020
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
H04N7/18; G06T7/20
Domestic Patent References:
| WO2018061976A1 | 2018-04-05 | |||
| WO2019229789A1 | 2019-12-05 | |||
| WO2014109127A1 | 2014-07-17 |
Foreign References:
| JP2011243031A | 2011-12-01 | |||
| JP2020093076A | 2020-06-18 | |||
| JP2017191621A | 2017-10-19 | |||
| JP2015049574A | 2015-03-16 |
Other References:
See also references of EP 4221197A4
Attorney, Agent or Firm:
HAYAMI Shinji (JP)
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