Title:
INPUT SAMPLING METHOD, INPUT SAMPLING CIRCUIT, AND SEMICONDUCTOR MEMORY
Document Type and Number:
WIPO Patent Application WO/2023/279482
Kind Code:
A1
Abstract:
An input sampling method, an input sampling circuit, and a semiconductor memory. The input sampling method comprises: receiving a first pulse signal and a second pulse signal; performing a logical operation on the first pulse signal and the second pulse signal, so as to determine a signal to be sampled, wherein the signal to be sampled is obtained by shielding an invalid signal in the second pulse signal according to a logical operation result; and performing sampling processing on the signal to be sampled, so as to obtain a target sampled signal. In this way, by means of performing a logical operation on a first pulse signal and a second pulse signal, an invalid signal in the second pulse signal can be shielded, such that a signal to be sampled is not subjected to level state inversion along with an invalid signal in the first pulse signal, thereby reducing the functional loss of an input sampling circuit.
Inventors:
HUANG ZEQUN (CN)
Application Number:
PCT/CN2021/112921
Publication Date:
January 12, 2023
Filing Date:
August 17, 2021
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G06F13/00
Foreign References:
| CN1737896A | 2006-02-22 | |||
| CN106055496A | 2016-10-26 | |||
| CN102347813A | 2012-02-08 | |||
| US20070101177A1 | 2007-05-03 |
Attorney, Agent or Firm:
CHINA PAT INTELLECTUAL PROPERTY OFFICE (CN)
Download PDF: