Title:
INSPECTING DEVICE AND INSPECTING METHOD
Document Type and Number:
WIPO Patent Application WO/2024/009570
Kind Code:
A1
Abstract:
This inspecting device comprises: an image acquiring unit (11) for acquiring a captured image of a chip accommodating a specimen; a determination result acquiring unit (14) for inputting the captured image acquired by the image acquiring unit (11) into a learning model, and acquiring a determination result that relates to a state of suction of the sample onto the chip and that is output from the learning model; and an output unit (15) for performing output processing based on the determination result acquired by the determination result acquiring unit (14).
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Inventors:
MIYOSHI MASAHIKO (JP)
Application Number:
PCT/JP2023/012837
Publication Date:
January 11, 2024
Filing Date:
March 29, 2023
Export Citation:
Assignee:
OTSUKA DENSHI KK (JP)
International Classes:
G01N35/00; G01N35/10
Domestic Patent References:
| WO2021094988A1 | 2021-05-20 |
Foreign References:
| JP2008175791A | 2008-07-31 | |||
| JP2016183945A | 2016-10-20 | |||
| JP2019101032A | 2019-06-24 | |||
| JP2017127407A | 2017-07-27 | |||
| JP2018105690A | 2018-07-05 | |||
| JP2015200527A | 2015-11-12 | |||
| JP2012117953A | 2012-06-21 | |||
| KR102206525B1 | 2021-01-22 |
Attorney, Agent or Firm:
ONEDEE IP PARTNERS (JP)
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