Title:
INSPECTION DEVICE, INSPECTION METHOD, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2020/183936
Kind Code:
A1
Abstract:
In the present invention, an acquisition unit 41B acquires an image of interest in which an object to be inspected is displayed. A detection unit 42B uses an image group in which objects in a normal state are displayed as a basis to detect an image of interest in which an object that is not in a normal state is displayed among the images of interest acquired by the acquisition unit 41B.
Inventors:
KIYUNA TOMOHARU (JP)
TAKAHASHI IKUMA (JP)
SANO MAKI (JP)
KAMIJO KENICHI (JP)
TAKOH KIMIYASU (JP)
KITAMURA YOSHIKAZU (JP)
TAKAHASHI IKUMA (JP)
SANO MAKI (JP)
KAMIJO KENICHI (JP)
TAKOH KIMIYASU (JP)
KITAMURA YOSHIKAZU (JP)
Application Number:
PCT/JP2020/002497
Publication Date:
September 17, 2020
Filing Date:
January 24, 2020
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
A61B1/045; A61B1/00; G02B23/24; G06T7/00
Domestic Patent References:
WO2018207334A1 | 2018-11-15 | |||
WO2018179991A1 | 2018-10-04 | |||
WO2018179991A1 | 2018-10-04 |
Foreign References:
JP2012523025A | 2012-09-27 |
Other References:
See also references of EP 3939490A4
Attorney, Agent or Firm:
NAKAMURA, Toshinobu et al. (JP)
Download PDF: