INSPECTION DEVICE

WIPO Patent Application WO/2019/159440

A1

The purpose of the present invention is to provide an inspection device capable of suppressing deterioration in the accuracy of an inspection of a product including a plurality of articles that can overlap with each other. An X-ray inspection device (10) irradiates a product (G) accommodating a plurality of articles (A) having predetermined shapes, and inspects the product (G) on the basis of an inspection image obtained from light transmitted through the product (G) and light reflected from the product (G). The X-ray inspection device (10) is provided with: a storage unit (51); a learning unit (52c); and an inspection unit (52d). The storage unit (10) stores, as at least a training image, the inspection image of the product (G) in which the plurality of articles (A) overlap each other. By means of machine learning using the training image stored in the storage unit (51), the learning unit (52c) acquires characteristics of the product (G) in which the plurality of articles (A) overlap each other. The inspection unit (52d) inspects the product (G) using the characteristics acquired by the learning unit (52c).

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JP2023145103	INFORMATION PROCESSING APPARATUS, MOVING BODY, SYSTEM, INFORMATION PROCESSING METHOD, PROGRAM, AND SERVER
JP2008071184	IMAGE PROCESSOR AND IMAGE PROCESSING METHOD

NAKATANI MAKOTO (JP)
TARUMOTO YOSHINORI (JP)
MAENAKA AKIHIRO (JP)
TSUTSUMI HIRONORI (JP)

PCT/JP2018/040271

August 22, 2019

October 30, 2018

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ISHIDA SEISAKUSHO (JP)

G06T7/00

WO2017061593A1	2017-04-13
WO2015041259A1	2015-03-26

JP2009192519A	2009-08-27
JP2012242289A	2012-12-10
JP2002228761A	2002-08-14

See also references of EP 3754594A4

SHINJYU GLOBAL IP (JP)

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