Title:
INSPECTION METHOD, INSPECTION DEVICE, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/029552
Kind Code:
A1
Abstract:
Provided is an inspection method that is for a display panel and that is carried out by a computer, said inspection method comprising: an acquisition step (S11) for acquiring an anomalous part image which is an image that has been obtained by carrying out image processing using a background subtraction method on an inspection image of a pixel region of the display panel and that includes an anomalous part of said pixel region; a generation step (S12) for using a trained generation model to generate, from the anomalous part image, a label image in which a region indicating the anomalous part has been converted into a color corresponding to a defect mode of the anomalous part; and a determination step (S13) for determining, on the basis of the color of said region in the label image, whether the defect mode of the anomalous part has the possibility of being a seepage defect in which light is not emitted due to deterioration of a functional layer in said pixel region, wherein the defect mode includes a dark dot defect and the seepage defect.
Inventors:
HASHIMOTO SHINICHIRO
Application Number:
PCT/JP2023/028231
Publication Date:
February 08, 2024
Filing Date:
August 02, 2023
Export Citation:
Assignee:
JOLED INC (JP)
International Classes:
G01N21/956; G06T7/00; G06V10/82
Domestic Patent References:
| WO2021154568A1 | 2021-08-05 |
Foreign References:
| JP2011085821A | 2011-04-28 | |||
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| JPH0821803A | 1996-01-23 | |||
| JP2004294202A | 2004-10-21 | |||
| JP2006234501A | 2006-09-07 | |||
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| CN104392432A | 2015-03-04 | |||
| US20210357693A1 | 2021-11-18 |
Attorney, Agent or Firm:
YOSHIKAWA, Shuichi et al. (JP)
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