Title:
INSPECTION SUPPORT DEVICE, METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/199830
Kind Code:
A1
Abstract:
Provided are an inspection support device, method, and program with which, if two or more types of damage are detected from a structure, in particular if two or more types of damage are detected from the same or similar positions in a structure, the results of the detection of the damage can be output satisfactorily. A processor of the inspection support device acquires an image obtained by imaging a structure to be inspected, and detects damage to the structure on the basis of the acquired image. If two or more types of damage to the structure (a crack B and a thread-like free lime C2) are detected, the processor detects whether the two or more types of damage have been detected from the same or adjacent positions. When outputting the damage detection results (damage image, damage drawing or the like), if it has been determined that the crack B and the thread-like free lime C2 have been detected from the same or adjacent positions, the processor preferentially outputs the damage detection result for the thread-like free lime C2 in accordance with an order of priority of the damage types (figure 14(B)).
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Inventors:
HORITA SHUHEI (JP)
Application Number:
PCT/JP2021/007649
Publication Date:
October 07, 2021
Filing Date:
March 01, 2021
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
G06T7/00; G01N21/88
Domestic Patent References:
| WO2017130699A1 | 2017-08-03 | |||
| WO2017056930A1 | 2017-04-06 | |||
| WO2018165753A1 | 2018-09-20 |
Foreign References:
| JP2006112127A | 2006-04-27 | |||
| JP2006170871A | 2006-06-29 | |||
| JP2002188998A | 2002-07-05 |
Other References:
See also references of EP 4131157A4
Attorney, Agent or Firm:
NAKASHIMA Junko et al. (JP)
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