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Title:
MAGNETIC PERMEABILITY MEASUREMENT PROBE AND MAGNETIC PERMEABILITY MEASUREMENT DEVICE USING SAME
Document Type and Number:
WIPO Patent Application WO/2023/228930
Kind Code:
A1
Abstract:
Provided is a magnetic permeability measurement probe capable of accurately measuring the magnetic permeability, in particular the imaginary part of a complex permeability, of a magnetic material. The probe for measuring the magnetic permeability of a magnetic material comprises: a band-shaped strip conductor formed on the front surface of a dielectric substrate; a transmission line body having a grounding conductor formed on the front surface or the back surface of the dielectric substrate; a first connector that connects to one end of each of the strip conductor and the grounding conductor; and a second connector that connects to the other end of each of the strip conductor and the grounding conductor. The strip conductor is composed of a first length part including a portion that connects to the first connector at the one end side, a second length part including a portion that connects to the second connector at the other end, and a third length part that extends between the first length part and the second length part. The third length part has a current imbalance reducing means.

Inventors:
YABUKAMI SHIN (JP)
OKITA KAZUHIKO (JP)
WATANABE YOSHIYUKI (JP)
Application Number:
PCT/JP2023/019074
Publication Date:
November 30, 2023
Filing Date:
May 23, 2023
Export Citation:
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Assignee:
UNIV TOHOKU (JP)
International Classes:
G01R33/12
Domestic Patent References:
WO2016156885A12016-10-06
Foreign References:
JP2021162413A2021-10-11
JP2021162327A2021-10-11
JP2016053569A2016-04-14
JP2012032165A2012-02-16
CN109884565A2019-06-14
CN106443198A2017-02-22
JP2005274381A2005-10-06
Attorney, Agent or Firm:
FIELDS IP ATTORNEYS PPC (JP)
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