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Title:
MEASUREMENT DEVICE, MEASUREMENT DEVICE CONTROL METHOD, AND MEASUREMENT DEVICE CONTROL PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/210360
Kind Code:
A1
Abstract:
Provided are a measurement system, a measurement system control method, and a measurement system control program that enable calculation of changes in current phases of three phases at low cost, even if a direction of rotation of three-phase power is not known. A measurement system of one embodiment is provided with: a first voltage measurement unit for measuring a first voltage that is a line voltage between a first phase and a second phase of a three-phase power line comprising three phases, namely the first phase, the second phase, and a third phase; a first current measurement unit for measuring a first current that is the current of the first phase; a third current measurement unit for measuring a third current that is the current of the third phase; a determination unit for determining a direction of rotation of the three phases on the basis of the first voltage and the first current; and a calculation unit for calculating changes in current phases due to a load device in the first current, the third current, and a second current that is the current of the second phase, on the basis of at least the determination of the direction of rotation by the determination unit.

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Inventors:
INOUE YASUHIKO (JP)
ONO TOMOYUKI (JP)
Application Number:
PCT/JP2021/012013
Publication Date:
October 21, 2021
Filing Date:
March 23, 2021
Export Citation:
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Assignee:
INFORMETIS CORP (JP)
International Classes:
G01R21/00; G01R21/133
Domestic Patent References:
WO2016121378A12016-08-04
Foreign References:
JP2018004330A2018-01-11
JPS62162977A1987-07-18
JP2007212266A2007-08-23
JP2004038765A2004-02-05
JP2016075587A2016-05-12
JP2000074959A2000-03-14
JP2001124806A2001-05-11
JPH0399370U1991-10-17
US20160349311A12016-12-01
US20190079117A12019-03-14
US20160033568A12016-02-04
JP2019053342A2019-04-04
JP2011072122A2011-04-07
Attorney, Agent or Firm:
SHIRASAKA & PATENT PARTNERS (JP)
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