Title:
MEASURING METHOD AND MEASURING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/079761
Kind Code:
A1
Abstract:
[Problem] To provide a measuring method and a measuring system with which measuring accuracy can be improved. [Solution] This measuring method is a method for measuring an object of measurement contained in a sample, and includes: a pass-through step of causing a complex 78, obtained by causing the object of measurement to react with a prescribed carrier, to pass through a pore 41 provided in a base plate 40, by electrophoresis or the like; a measuring step of measuring the size of the complex 78 on the basis of an electrical change caused when the complex 78 is caused to pass through the pore 41 in the pass-through step; and an identifying step of identifying the number of objects of measurement on the basis of the size of the complex 78 measured in the measuring step.
Inventors:
MATSUNO TATSUKI (JP)
HIKI SHINICHIRO (JP)
OKA AKIHIRO (JP)
HIKI SHINICHIRO (JP)
OKA AKIHIRO (JP)
Application Number:
PCT/JP2017/039057
Publication Date:
May 03, 2018
Filing Date:
October 30, 2017
Export Citation:
Assignee:
FUJIREBIO KK (JP)
International Classes:
G01N27/00; C12Q1/68; G01N33/543
Foreign References:
| JP2014173936A | 2014-09-22 | |||
| JP2014035229A | 2014-02-24 | |||
| JP2014149216A | 2014-08-21 |
Other References:
See also references of EP 3534153A4
Attorney, Agent or Firm:
SAITO Tatsuya (JP)
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