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Patent Searching and Data


Title:
METHOD FOR ADJUSTING FLAW DETECTION SENSITIVITY OF ULTRASONIC PROBE AND ABNORMALITY DIAGNOSTIC METHOD
Document Type and Number:
WIPO Patent Application WO/2013/176039
Kind Code:
A1
Abstract:
[Problem] To provide a method that suitably adjusts flaw detection sensitivity in an array-type ultrasonic probe. [Solution] This method for adjusting flaw detection sensitivity includes: a step for disposing a plate shaped body and ultrasonic probe facing each other such that the front surface of a plate shaped body (P1), having a front surface and bottom surface that are substantially parallel to each other, and the direction of arrangement of oscillators (11) are substantially parallel or disposing a tube shaped body (P2) facing the ultrasonic probe such that the axial direction of the tube shaped body and the direction of arrangement of the oscillators is substantially parallel; a step for sending ultrasonic waves from each oscillator toward the front surface of the plate shaped body or the outside surface of the tube shaped body and receiving echoes from the bottom surface of the plate shaped body or the inside surface of the tube shaped body by each oscillator; and a step for adjusting the flaw detection sensitivity of each oscillator such that the intensities of the echoes received by each oscillator are substantially equal.

Inventors:
YAMANO MASAKI (JP)
NAKAO YOSHIYUKI (JP)
HYODO SHIGETOSHI (JP)
TANAKA MASAKI (JP)
SUDA TSUKASA (JP)
Application Number:
PCT/JP2013/063737
Publication Date:
November 28, 2013
Filing Date:
May 17, 2013
Export Citation:
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Assignee:
NIPPON STEEL & SUMITOMO METAL CORP (JP)
International Classes:
G01N29/30
Foreign References:
JP2006047328A2006-02-16
JPH05188138A1993-07-30
JPS60260850A1985-12-24
JPS6170459A1986-04-11
JPH10227772A1998-08-25
JPH10227769A1998-08-25
JPH06125901A1994-05-10
JPH11160293A1999-06-18
JPS5391793A1978-08-11
Attorney, Agent or Firm:
OHNAKA Minoru (JP)
Minoru Onaka (JP)
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