Title:
METHOD FOR ESTIMATING ABNORMAL PART OF OBJECT BEING SURVEYED
Document Type and Number:
WIPO Patent Application WO/2018/008637
Kind Code:
A1
Abstract:
The present invention addresses the problem of providing a method for estimating an abnormal part of an object being surveyed, wherein the method makes it possible to estimate accurately and in a short time an abnormal part inside the object being surveyed.
As a means of overcoming the problem, the method according to the present invention includes: a step of receiving a reflected wave of an electromagnetic wave from inside the object being surveyed, and storing reflected wave data corresponding to a unit measurement sector (12); a step of calculating a degree of coincidence between the reflected wave data relating to a unit measurement sector in an arbitrarily defined position, and the reflected wave data relating to a different unit measurement sector in another position in a scanning direction, and on the basis of the degree of coincidence, estimating a normal unit measurement sector inside the object being surveyed; a step of using data corresponding to the normal unit measurement sector as reference reflected wave data, and calculating a degree of coincidence between the reflected wave data and the reference reflected wave data; and a step of estimating an abnormal sector on the basis of the degree of coincidence with the reference reflected wave data.
Inventors:
MIZUTANI TSUKASA (JP)
Application Number:
PCT/JP2017/024502
Publication Date:
January 11, 2018
Filing Date:
July 04, 2017
Export Citation:
Assignee:
UNIV TOKYO (JP)
International Classes:
G01N22/02; E01C23/01; G01N22/00; G01S13/88
Foreign References:
| JP2005331404A | 2005-12-02 | |||
| JPH01180486A | 1989-07-18 | |||
| JP2008039429A | 2008-02-21 | |||
| JP2009244076A | 2009-10-22 |
Other References:
DAISUKE SUGA ET AL.: "Denjiha Radar ni yoru Tekkin Concrete Kozobutsu no Hihakai Kensa", THE 12TH ANNUAL CONFERENCE OF SICE CHUGOKU BRANCH RONBUNSHU, 29 November 2003 (2003-11-29), pages 50 - 51
Attorney, Agent or Firm:
WATANUKI PATENT SERVICE BUREAU (JP)
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