Title:
METHOD FOR INSPECTING LUMINESCENT ELEMENTS
Document Type and Number:
WIPO Patent Application WO/2024/053198
Kind Code:
A1
Abstract:
Disclosed is an inspection method comprising: forming a buffer layer on an amorphous substrate; forming an n-type clad layer, a luminescent layer, and a p-type clad layer each including an inorganic semiconductor, on the buffer layer to thereby form a plurality of semiconductor layers disposed in a matrix arrangement having a plurality of lines and a plurality of rows; forming an anode and a cathode on each of the plurality of semiconductor layers, thereby forming a plurality of luminescent elements; and using a first detector and a second detector to acquire the photoluminescent properties and/or the electroluminescent properties of the plurality of luminescent elements. The buffer layer has the function of accelerating the crystallization of the semiconductor layers. The photoluminescent properties and the electroluminescent properties are each acquired before and after the formation of the anodes and cathodes.
Inventors:
IKEDA MASANOBU (JP)
Application Number:
PCT/JP2023/022261
Publication Date:
March 14, 2024
Filing Date:
June 15, 2023
Export Citation:
Assignee:
JAPAN DISPLAY INC (JP)
International Classes:
H01L33/00
Domestic Patent References:
| WO2022209266A1 | 2022-10-06 |
Foreign References:
| JP2015010834A | 2015-01-19 | |||
| JP2015226008A | 2015-12-14 | |||
| JP6723484B1 | 2020-07-15 | |||
| JPH118438A | 1999-01-12 | |||
| US20070170933A1 | 2007-07-26 | |||
| JP2010239041A | 2010-10-21 | |||
| JP2012084883A | 2012-04-26 | |||
| US20030122561A1 | 2003-07-03 | |||
| JP2020109392A | 2020-07-16 | |||
| JP2015148447A | 2015-08-20 |
Attorney, Agent or Firm:
TAKAHASHI, HAYASHI AND PARTNER PATENT ATTORNEYS, INC. (JP)
Download PDF: