Title:
MICRO-FORCE MEASURING TYPE THREE-DIMENSIONAL COMPREHENSIVE THREAD MEASURING MACHINE MEASURING HEAD AND MEASURING METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2022/012103
Kind Code:
A1
Abstract:
A micro-force measuring type three-dimensional comprehensive thread measuring machine measuring head and a measuring method therefor, capable of simply and accurately measure the displacements of a probe so as to measure a spatial position of a measured thread. The micro displacements of the probe in a horizontal direction and a vertical direction are respectively measured by means of a transverse micro displacement measuring system and a longitudinal micro displacement measuring system. After the probe is in pre-contact with the measured thread and is driven by a three-dimensional comprehensive thread measuring machine, the probe respectively displaces in the horizontal direction and the vertical direction, two groups of parallel reeds serve as guide mechanisms and are respectively stretched, reading heads and grating scales of linear grating systems relatively displace, and the displacements are measured.
Inventors:
XIAO TIAN (CN)
ZHANG PENG (CN)
ZOU GONG WEN (CN)
YU JING (CN)
CAI JINHUI (CN)
ZHANG PENG (CN)
ZOU GONG WEN (CN)
YU JING (CN)
CAI JINHUI (CN)
Application Number:
PCT/CN2021/088145
Publication Date:
January 20, 2022
Filing Date:
April 19, 2021
Export Citation:
Assignee:
CHOTEST TECH INC (CN)
International Classes:
G01B11/00
Foreign References:
| CN111947571A | 2020-11-17 | |||
| CN102538678A | 2012-07-04 | |||
| US4078314A | 1978-03-14 | |||
| US5390424A | 1995-02-21 |
Other References:
XIMENG LIN, JING YU, YANLING YANG, JINHUI CAI, DONGSHENG LI: "Study on contact scanning probe dynamic characteristics of high precision 3D thread measuring machine", CHINESE JOURNAL OF SCIENTIFIC INSTRUMENT, vol. 42, 1 January 2021 (2021-01-01), XP055887782
ZHENG, ZHIWEI: "Development of a Grating Two-dimensional Scanning Probe", CHINA MASTER’S THESES FULL-TEXT DATABASE, 1 June 2012 (2012-06-01), XP055887784, [retrieved on 20220204]
ZHENG, ZHIWEI: "Development of a Grating Two-dimensional Scanning Probe", CHINA MASTER’S THESES FULL-TEXT DATABASE, 1 June 2012 (2012-06-01), XP055887784, [retrieved on 20220204]
Attorney, Agent or Firm:
SZ KINDWALF INTELLECTUAL PROPERTY FIRM (CN)
Download PDF: