Title:
MONITORING DESIGN ASSISTANCE DEVICE, MONITORING DESIGN ASSISTANCE METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2022/209304
Kind Code:
A1
Abstract:
Provided are a monitoring design assistance device, a monitoring design assistance method, and a program that make it possible to efficiently monitor a structure. Provided is a monitoring design assistance device that comprises a processor and assists monitoring design for a structure. The processor executes structural information acquisition processing that acquires structural information about a target structure, monitoring candidate position determination processing that, on the basis of the structural information about the target structure, determines monitoring candidate positions at which damage could easily occur, damage information acquisition processing that acquires damage information about the target structure that includes information about damage locations on the target structure and the degrees of damage, monitoring position determination processing that determines monitoring positions from among the monitoring candidate positions on the basis of the degrees of damage included in the damage information about the target structure that corresponds to the monitoring candidate positions, and output processing that outputs the monitoring positions.
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Inventors:
HORITA SHUHEI (JP)
Application Number:
PCT/JP2022/004710
Publication Date:
October 06, 2022
Filing Date:
February 07, 2022
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
G06Q50/08; G06Q10/00
Domestic Patent References:
| WO2017110278A1 | 2017-06-29 |
Foreign References:
| JP2019023901A | 2019-02-14 | |||
| JP2017071972A | 2017-04-13 |
Attorney, Agent or Firm:
YONEKURA Junzo et al. (JP)
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