Title:
MULTI-PARAMETER SYNCHRONOUS MEASUREMENT METHOD AND APPARATUS, AND ELECTRONIC DEVICE AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/077914
Kind Code:
A1
Abstract:
A multi-parameter synchronous measurement method, comprising: controlling a light source to irradiate an object to be measured (S11); obtaining a first image of said object under the irradiation of the light source (S12); using gray values of a plurality of second wavebands of the first image to correct gray values of a plurality of third wavebands of the first image, and removing radiation light in the plurality of third wavebands of the first image to obtain a second image (S13); determining a temperature field of said object according to a gray value of at least one waveband of the second image and a reference temperature of said object (S14); and determining a deformation field of said object according to a gray value of the at least one target waveband of the second image (S15). Further provided are a multi-parameter synchronous measurement apparatus, an electronic device, and a computer-readable storage medium.
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Inventors:
FENG XUE (CN)
TANG YUNLONG (CN)
WANG JINYANG (CN)
ZHANG JINSONG (CN)
YUE MENGKUN (CN)
TANG YUNLONG (CN)
WANG JINYANG (CN)
ZHANG JINSONG (CN)
YUE MENGKUN (CN)
Application Number:
PCT/CN2022/113720
Publication Date:
May 11, 2023
Filing Date:
August 19, 2022
Export Citation:
Assignee:
UNIV TSINGHUA (CN)
International Classes:
G01D21/02; G01D5/26
Foreign References:
| CN111429540A | 2020-07-17 | |||
| CN114018324A | 2022-02-08 | |||
| CN110057399A | 2019-07-26 | |||
| CN110954222A | 2020-04-03 | |||
| CN112683338A | 2021-04-20 | |||
| CN111707381A | 2020-09-25 | |||
| CN106768382A | 2017-05-31 | |||
| JP2008020384A | 2008-01-31 | |||
| US20150124244A1 | 2015-05-07 |
Attorney, Agent or Firm:
LINDA LIU & PARTNERS (CN)
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