Title:
OFF-FILM METERING SYSTEM FOR ELECTRONIC FILM CAMERAS
Document Type and Number:
WIPO Patent Application WO2001007965
Kind Code:
A3
Abstract:
An electronic imaging system that works in combination with an off-the-film (OTF) metering system intended for photographic film is described. The imaging system includes a combination of anti-reflection coatings, diffuse reflective coatings, and light absorbing coatings to control the reflections from the imaging system and thereby reduce reflections what would cause the OTF metering system to produce a false reading. The coatings are applied to the image sensor package and other surrounding components having high reflection properties. The geometrical arrangement and relative combinations of these reflectance-modifying treatments can be tailored to the particular geometry of the OTF metering system as well as the sensor and electronic component placement in the electronic imager system.
Inventors:
WHALEN MATTHEW S (US)
SAPIR ITZHAK (US)
STERN JONATHAN MICHAEL (US)
SAPIR ITZHAK (US)
STERN JONATHAN MICHAEL (US)
Application Number:
PCT/US2000/040482
Publication Date:
March 22, 2001
Filing Date:
July 26, 2000
Export Citation:
Assignee:
WHALEN MATTHEW S (US)
SAPIR ITZHAK (US)
STERN JONATHAN MICHAEL (US)
SAPIR ITZHAK (US)
STERN JONATHAN MICHAEL (US)
International Classes:
G03B7/099; (IPC1-7): G03B7/099
Domestic Patent References:
| WO1992020007A1 | 1992-11-12 |
Foreign References:
| DE19617580A1 | 1997-11-06 | |||
| EP0543179A1 | 1993-05-26 |
Other References:
PATENT ABSTRACTS OF JAPAN vol. 015, no. 278 (P - 1227) 15 July 1991 (1991-07-15)
PATENT ABSTRACTS OF JAPAN vol. 007, no. 109 (P - 196) 12 May 1983 (1983-05-12)
PATENT ABSTRACTS OF JAPAN vol. 007, no. 109 (P - 196) 12 May 1983 (1983-05-12)
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