Title:
OPTICAL MEASUREMENT SYSTEM AND PROBE
Document Type and Number:
WIPO Patent Application WO/2022/050231
Kind Code:
A1
Abstract:
Provided is an optical measurement system that measures the spectral reflectivity of a sample. This optical measurement system includes: a light source that generates measurement light; a light-receiving unit that receives, as observation light, light that is produced when the sample is irradiated with the measurement light; a probe that is optically connected to the light source and the light-receiving unit and that can be positioned at a discretionary position; and a computation processing unit that measures the spectral reflectivity of a sample ont he basis of the result of detection by the light-receiving unit and that calculates a measurement result based on the measured spectral reflectivity. The probe includes a body part that is gripped by a user, and a flexible part that is capable of bending such that the measurement light can impinge perpendicularly on the sample.
Inventors:
INANO DAISUKE (JP)
KAWAGUCHI SHIRO (JP)
KAWAGUCHI SHIRO (JP)
Application Number:
PCT/JP2021/031779
Publication Date:
March 10, 2022
Filing Date:
August 30, 2021
Export Citation:
Assignee:
OTSUKA DENSHI KK (JP)
International Classes:
G01J3/02; G01B11/06
Foreign References:
| JP2004340589A | 2004-12-02 | |||
| JPH10512042A | 1998-11-17 | |||
| JP2017037072A | 2017-02-16 | |||
| JP2006162513A | 2006-06-22 | |||
| US20190078871A1 | 2019-03-14 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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