Title:
OPTICAL WAVEFORM MEASUREMENT DEVICE AND OPTICAL WAVEFORM MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2021/246125
Kind Code:
A1
Abstract:
This optical waveform measurement device comprises: a detection means (13) for detecting candidates of a light-amount fluctuation frequency of a measurement target (100); a frequency determination means (14) for determining the light-amount fluctuation frequency on the basis of the detected candidates of the light-amount fluctuation frequency; a measurement condition determination means (15) for determining a measurement condition for optical waveform measurement on the basis of the determined light-amount fluctuation frequency; and an acquisition means (16) for acquiring an optical waveform of the measurement target under the determined measurement condition. The measurement condition determination means (15) determines the number of measurement points and a sampling frequency at which a measurement time becomes an integral multiple of a period of the light-amount fluctuation frequency determined by the frequency determination means (14).
Inventors:
MASUDA SATOSHI (JP)
Application Number:
PCT/JP2021/018217
Publication Date:
December 09, 2021
Filing Date:
May 13, 2021
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01J1/44; G01J11/00; G01M11/00; G01R23/16
Domestic Patent References:
| WO2019069634A1 | 2019-04-11 | |||
| WO2019069633A1 | 2019-04-11 |
Foreign References:
| JP2003106898A | 2003-04-09 | |||
| JP2019100868A | 2019-06-24 | |||
| US20050103979A1 | 2005-05-19 |
Attorney, Agent or Firm:
TAKATA Kenichi (JP)
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