Title:
PRODUCT QUALITY ANALYSIS ASSISTANCE SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/181127
Kind Code:
A1
Abstract:
This product quality analysis assistance system is applied to a steel plant. In a first process, a plurality of defective waveform patterns determined to be defective in quality are classified into at least one defective waveform pattern group on the basis of similarity. In a second process, a score of correlation with a condition based on product specifications and a process data waveform pattern is calculated for the defective waveform pattern group. In a third process, when the score of correlation indicating characteristics of the defective waveform pattern group is greater than a condition threshold, an input screen including a representative waveform pattern representing the defective waveform pattern group, information according to the score of correlation, and a factor and countermeasure input area is displayed on a monitor.
Inventors:
INAMI HARUKI (JP)
Application Number:
PCT/JP2022/013235
Publication Date:
September 28, 2023
Filing Date:
March 22, 2022
Export Citation:
Assignee:
TOSHIBA MITSUBISHI ELEC IND (JP)
International Classes:
G06Q50/04
Foreign References:
| JP2021192915A | 2021-12-23 | |||
| JP2014179060A | 2014-09-25 |
Attorney, Agent or Firm:
TAKADA, TAKAHASHI & PARTNERS (JP)
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